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Research Output 1900 2019

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Review article
2017
9 Citations (Scopus)

Review of radiation effects on ReRAM devices and technology

Gonzalez Velo, Y., Barnaby, H. & Kozicki, M., Jul 3 2017, In : Semiconductor Science and Technology. 32, 8, 083002.

Research output: Contribution to journalReview article

Radiation effects
random access memory
radiation effects
Data storage equipment
resilience
2016
33 Citations (Scopus)

Conductive bridging random access memory - Materials, devices and applications

Kozicki, M. & Barnaby, H., Oct 5 2016, In : Semiconductor Science and Technology. 31, 11, 113001.

Research output: Contribution to journalReview article

random access memory
Ions
Data storage equipment
filaments
ions