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Dive into the research topics of 'Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose'. Together they form a unique fingerprint.- Sort by
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Madeline G. Esposito, Jack E. Manuel, Aymeric Privat, T. Patrick Xiao, Diana Garland, Edward Bielejec, Gyorgy Vizkelethy, Jeramy Dickerson, John Brunhaver, A. Alec Talin, David Ashby, Michael P. King, Hugh Barnaby, Michael McLain, Matthew J. Marinella
Research output: Contribution to journal › Article › peer-review