Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose

Madeline G. Esposito, Jack E. Manuel, Aymeric Privat, T. Patrick Xiao, Diana Garland, Edward Bielejec, Gyorgy Vizkelethy, Jeramy Dickerson, John Brunhaver, A. Alec Talin, David Ashby, Michael P. King, Hugh Barnaby, Michael McLain, Matthew J. Marinella

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Engineering & Materials Science

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