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Dive into the research topics of 'Effects of different defect types on the performance of devices fabricated on a 4H-SiC homoepitaxial layer'. Together they form a unique fingerprint.- Sort by
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Hui Chen, Balaji Raghothamachar, William Vetter, Michael Dudley, Y. Wang, Brian Skromme
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution