• 12198 Citations
  • 46 h-Index
1977 …2023
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Personal profile

Education/Academic qualification

PHD, University of Cambridge

… → 1980

BA, University of Cambridge

… → 1976

Fingerprint Dive into the research topics where Michael Treacy is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Zeolites Chemical Compounds
Microscopic examination Engineering & Materials Science
microscopy Physics & Astronomy
Transmission electron microscopy Engineering & Materials Science
electron microscopy Physics & Astronomy
Electron microscopy Engineering & Materials Science
Diffraction Engineering & Materials Science
Amorphous silicon Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1977 2018

33 Citations (Scopus)

The geometry of periodic knots, polycatenanes and weaving from a chemical perspective: A library for reticular chemistry

Liu, Y., O'Keeffe, M., Treacy, M. & Yaghi, O. M., Jun 21 2018, In : Chemical Society Reviews. 47, 12, p. 4642-4664 23 p.

Research output: Contribution to journalReview article

Crystal structure
1 Citation (Scopus)

Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials

Collins, S. M., Leary, R. K., Midgley, P. A., Tovey, R., Benning, M., Schönlieb, C. B., Rez, P. & Treacy, M., Oct 16 2017, In : Physical Review Letters. 119, 16, 166101.

Research output: Contribution to journalArticle

amorphous materials
4 Citations (Scopus)

Fluctuation microscopy analysis of amorphous silicon models

Gibson, J. M. & Treacy, M., May 1 2017, In : Ultramicroscopy. 176, p. 74-79 6 p.

Research output: Contribution to journalArticle

Amorphous silicon
Electron microscopy
amorphous silicon
electron microscopy
Microscopic examination
1 Citation (Scopus)

Interferometric Diffraction from Amorphous Double Films

Rezikyan, A., Belcourt, J. A. & Treacy, M., Mar 5 2015, In : Microscopy and Microanalysis. 21, 5, p. 1348-1360 13 p.

Research output: Contribution to journalArticle

Electron scattering
Diffraction patterns
12 Citations (Scopus)

Speckle Suppression by Decoherence in Fluctuation Electron Microscopy

Rezikyan, A., Jibben, Z. J., Rock, B. A., Zhao, G., Koeck, F. A. M., Nemanich, R. & Treacy, M., 2015, In : Microscopy and Microanalysis. 21, 6, p. 1455-1474 20 p.

Research output: Contribution to journalArticle

Electron microscopy
electron microscopy
electron diffraction

Projects 2004 2023