• 12198 Citations
  • 46 h-Index
1977 …2023
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Research Output 1977 2018

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2013

Photo induced electron emission from nitrogen doped diamond films on silicon

Sun, T., Koeck, F. A. M., Rezikyan, A., Treacy, M. & Nemanich, R., 2013, 2013 26th International Vacuum Nanoelectronics Conference, IVNC 2013. 6624728

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron emission
Diamond films
Nitrogen
Thermionic emission
Silicon
2007

Characterization of medium-range order in self-assembled organic-inorganic hybrid by fluctuation X-ray microscopy

Fan, L., Paterson, D., McNulty, I., Treacy, M., Kumar, D., Du, P., Wiesner, U. & Murray Gibson, J., 2007, Materials Research Society Symposium Proceedings. Vol. 960. p. 62-67 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanostructures
Microscopic examination
X rays
Aluminosilicates
Polyethylene oxides
2005
1 Citation (Scopus)

Fluctuation X-ray microscopy for measuring medium-range order

Fan, L., McNulty, I., Paterson, D., Treacy, M. & Murray Gibson, J., 2005, Materials Research Society Symposium Proceedings. Bhatia, S. R., Khalifah, P. G., Pochan, D. J. & Radaelli, P. G. (eds.). Vol. 840. p. 137-142 6 p. Q6.7

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microscopic examination
X rays
Speckle
Order disorder transitions
Momentum transfer
2003

Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials

Treacy, M. & Gibson, J. M., 2003, Proceedings of SPIE - The International Society for Optical Engineering. Weissman, M. B., Israeloff, N. E. & Kogan, A. S. (eds.). Vol. 5112. p. 48-60 13 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microscopic examination
microscopy
Amorphous semiconductors
amorphous semiconductors
starches

Metamict Transformation of Silica

Cheng, J. Y., Treacy, M. & Keblinski, P. J., 2003, Materials Research Society Symposium - Proceedings. Abelson, J. R., Ganguly, G., Matsumura, H., Robertson, J. & Schiff, E. A. (eds.). Vol. 762. p. 45-50 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon Dioxide
Quartz
Silica
Electrons
Speckle
2001
5 Citations (Scopus)

Control of medium range order in amorphous silicon via ion and neutral bombardment

Gerbi, J. E., Voyles, P. M., Treacy, M., Gibson, J. M., Chen, W., Heuser, B. J. & Abelson, J. R., 2001, Materials Research Society Symposium - Proceedings. Stutzmann, M., Boyce, J., Cohen, J. D., Collins, R. & Hanna, J. (eds.). Vol. 664.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Amorphous silicon
Ions
Spectroscopic ellipsometry
Electron energy levels
Electron microscopy
6 Citations (Scopus)

Designability of graphitic cones

Treacy, M. & Kilian, J., 2001, Materials Research Society Symposium - Proceedings. Robertson, J., Friedmann, T., Geohegan, D., Luzzi, D. & Ruoff, R. (eds.). Vol. 675.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Seed
Cones
Soot
Graphite
Carbon black
2000
10 Citations (Scopus)

Comparative fluctuation microscopy study of medium-range order in hydrogenated amorphous silicon deposited by various methods

Voyles, P. M., Treacy, M., Jin, H. C., Abelson, J. R., Gibson, J. M., Yang, J., Guha, S. & Crandall, R. S., 2000, Materials Research Society Symposium - Proceedings. Collins, R. W., Branz, H. M., Stutzmann, M., Guha, S. & Okamoto, H. (eds.). Vol. 609.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Amorphous silicon
Microscopic examination
Plasma enhanced chemical vapor deposition
Dilution
Crystals
2 Citations (Scopus)

Displacement charge patterns and ferroelectric domain wall dynamics studied by in-situ TEM

Krishnan, A., Treacy, M., Bisher, M. E., Chandra, P. & Littlewood, P. B., 2000, Materials Research Society Symposium - Proceedings. Materials Research Society, Vol. 596. p. 161-166 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Domain walls
Ferroelectric materials
Transmission electron microscopy
Barium titanate
Electron energy levels
4 Citations (Scopus)

Thermodynamics of paracrystalline silicon

Voyles, P. M., Treacy, M. & Gibson, J. M., 2000, Materials Research Society Symposium - Proceedings. Wadley, H. N. G., Gilmer, G. H. & Barker, W. G. (eds.). Vol. 616. p. 47-52 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Thermodynamics
Temperature
Amorphous silicon
Microscopic examination
2 Citations (Scopus)

Topological signatures of medium range order in amorphous semiconductor models

Treacy, M., Voyles, P. M. & Gibson, J. M., 2000, Materials Research Society Symposium - Proceedings. Collins, R. W., Branz, H. M., Stutzmann, M., Guha, S. & Okamoto, H. (eds.). Vol. 609.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Semiconductor device models
Amorphous semiconductors
Diamond
Short circuit currents
Diamonds
1999
1 Citation (Scopus)

Changes in the medium range order of α-Si: H thin films observed by variable coherence TEM

Gibson, J. M., Treacy, M., Voyles, P. M., Abelson, J. R. & Jin, H. C., 1999, Materials Research Society Symposium - Proceedings. Schropp, R., Branz, H. M., Hack, M., Shimizu, I. & Wagner, S. (eds.). MRS, Vol. 507. p. 837-842 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Transmission electron microscopy
Thin films
Hydrogen
Microscopic examination
1997
2 Citations (Scopus)

Electron speckle and higher-order correlation functions from amorphous thin films

Gibson, M. J., Treacy, M. & Loretto, D., 1997, Materials Research Society Symposium - Proceedings. Gray, W. J. & Triay, I. R. (eds.). Materials Research Society, Vol. 455. p. 349-356 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Amorphous semiconductors
Amorphous films
Speckle
Thin films
Electrons
1993

Hollow-cone analysis of intercalated particles in layered H(Ca 2Na n-3Nb nO 3n+1) materials

Treacy, M., Bisher, M. E. & Jacobson, A. J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 748-749 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cones
Coherent scattering
Dispersions
Perovskite
Microscopes
1986
3 Citations (Scopus)

DETECTION AND IMAGING OF SUPPORTED CATALYST PARTICLES.

Treacy, M., 1986, Materials Research Society Symposia Proceedings. Pittsburgh, PA, USA: Materials Research Soc, Vol. 62. p. 367-378 12 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Catalyst supports
Detectors
Imaging techniques
Cones
Lighting
1985
2 Citations (Scopus)

ELASTIC RELAXATION IN COMPOSITIONALLY-MODULATED THIN FOILS.

Treacy, M., Gibson, J. M. & Hull, R., 1985, Unknown Host Publication Title. Warrendale, PA, USA: Metallurgical Soc of AIME, p. 1179-1185 7 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Superlattices
Metal foil
Surface relaxation
Semiconductor materials
Transmission electron microscopy

LATTICE RELAXATION IN THIN COMPOSITIONALLY-MODULATED SEMICONDUCTOR FILMS.

Gibson, J. M., Treacy, M., Bean, J. C. & Hull, R., 1985, Institute of Physics Conference Series. 76 ed. p. 277-281 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Crystal lattices
Semiconductor materials
Superlattices
Lattice constants
Diffraction
1984
1 Citation (Scopus)

ATOMIC NUMBER IMAGING OF SUPPORTED CATALYST PARTICLES BY SCANNING TRANSMISSION ELECTRON MICROSCOPE.

Treacy, M., 1984, ACS Symposium Series. Whyte, T. E. J., Dalla Betta, R. A., Derouane, E. G. & Baker, R. T. K. (eds.). Washington, DC, USA: ACS, p. 367-383 17 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Catalyst supports
Electron microscopes
Scanning
Imaging techniques
Atoms
1982
8 Citations (Scopus)

INTERFACE SPINODAL DECOMPOSITION IN LPE In//xGa//1//-//xAs//yP//1//-//y LATTICE MATCHED TO InP.

Glas, F., Treacy, M., Quillec, M. & Launois, H., Dec 1982, Journal de Physique (Paris), Colloque. 12 ed. Vol. 43. p. 11-16 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Spinodal decomposition