• 12198 Citations
  • 46 h-Index
1977 …2023
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Research Output 1977 2018

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Chapter
2012
1 Citation (Scopus)

Speckles in Images and Diffraction Patterns

Treacy, M., May 23 2012, Handbook of Nanoscopy. Wiley-VCH, Vol. 1. p. 405-435 31 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Speckle
Diffraction patterns
2002
7 Citations (Scopus)

Efficient switching and domain interlocking observed in polyaxial ferroelectrics

Krishnan, A., Treacy, M., Bisher, M. E., Chandra, P. & Littlewood, P. B., 2002, Integrated Ferroelectrics. Vol. 43. p. 31-49 19 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Domain walls
locking
Ferroelectric materials
domain wall
Polarization
2000
9 Citations (Scopus)

Experimental methods and data analysis for fluctuation microscopy

Voyles, P. M., Treacy, M., Gibson, J. M., Jin, H. C. & Abelson, J. R., 2000, Materials Research Society Symposium - Proceedings. Vol. 589. p. 155-160 6 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Imaging systems
Metal foil
Electron microscopy
Statistical methods
Microscopic examination
1 Citation (Scopus)

Ion-implanted amorphous silicon studied by variable coherence TEM

Cheng, J. Y., Gibson, J. M., Voyles, P. M., Treacy, M. & Jacobson, D. C., 2000, Materials Research Society Symposium - Proceedings. Vol. 589. p. 247-252 6 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Amorphous silicon
Ions
Transmission electron microscopy
Structural relaxation
Silicon
1999
12 Citations (Scopus)

In-situ TEM study of domain propagation in ferroelectric barium titanate, and its role in fatigue

Krishnan, A., Bisher, M. E. & Treacy, M., 1999, Materials Research Society Symposium - Proceedings. Materials Research Society, Vol. 541. p. 475-480 6 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Barium titanate
Ferroelectric materials
Irradiation
Fatigue of materials
Transmission electron microscopy
8 Citations (Scopus)

The structure of ion-implanted amorphous silicon

Gibson, J. M., Cheng, J. Y., Voyles, P., Treacy, M. & Jacobson, D. C., 1999, Materials Research Society Symposium - Proceedings. Vol. 540. p. 27-30 4 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Amorphous silicon
Ions
Amorphous semiconductors
Microscopic examination
Crystalline materials
1991
510 Citations (Scopus)

A general recursion method for calculating diffracted intensities from crystals containing planar faults

Treacy, M., Newsam, J. M. & Deem, M. W., 1991, Proceedings - Royal Society of London, A. 1889 ed. Vol. 433. p. 499-520 22 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

stacking
crystal
zeolite
diamond
method