Research Output per year
Personal profile
Education/Academic qualification
PHD, Vanderbilt University
… → 2002
MS EE, Vanderbilt University
… → 1999
BA, University of California-Berkeley
… → 1992
Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.
- 4 Similar Profiles
Radiation
Engineering & Materials Science
dosage
Physics & Astronomy
radiation
Physics & Astronomy
Ionizing radiation
Engineering & Materials Science
Metallizing
Engineering & Materials Science
Oxides
Engineering & Materials Science
Networks (circuits)
Engineering & Materials Science
Radiation effects
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 1997 2018
Bias temperature instability model using dynamic defect potential for predicting CMOS aging
Fang, R., Livingston, I., Esqueda, I. S., Kozicki, M. & Barnaby, H., Jun 14 2018, In : Journal of Applied Physics. 123, 22, 225701Research output: Contribution to journal › Article
Dynamic models
Aging of materials
Defects
Surface potential
Computer hardware description languages
1
Citations
Hydrogen Soaking, Displacement-Damage Effects, and Charge Yield in Gated Lateral Bipolar Junction Transistors
Li, X., Yang, J., Fleetwood, D. M., Liu, C., Wei, Y. D., Barnaby, H. J. & Galloway, K. F., May 15 2018, (Accepted/In press) In : IEEE Transactions on Nuclear Science.Research output: Contribution to journal › Article
junction transistors
Electron irradiation
soaking
Bipolar transistors
electron irradiation
Impact ionization and interface trap generation in 28nm MOSFETs at cryogenic temperatures
Yan, X., Wang, H., Barnaby, H. & Esqueda, I. S., Aug 11 2018, (Accepted/In press) In : IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article
Impact ionization
Electron scattering
Cryogenics
Electrons
Hot carriers
Improved Model for Excess Base Current in Irradiated Lateral PNP Bipolar Junction Transistors
Tolleson, B. S., Adell, P. C., Rax, B., Barnaby, H. J., Privat, A., Han, X., Mahmud, A. & Livingston, I., Apr 20 2018, (Accepted/In press) In : IEEE Transactions on Nuclear Science.Research output: Contribution to journal › Article
junction transistors
Bipolar transistors
bipolar transistors
degradation
Radiation
A Comparative Study on TID Influenced Lateral Diffusion of Group 11 Metals into GexS1-x and GexSe1-x Systems: A Flexible Radiation Sensor Development Perspective
Mahmud, A., Gonzalez-Velo, Y., Barnaby, H. J., Kozicki, M. N., Mitkova, M., Holbert, K. E., Goryll, M., Alford, T. L., Taggart, J. L. & Chen, W., Aug 1 2017, In : IEEE Transactions on Nuclear Science. 64, 8, p. 2292-2299 8 p., 7882640Research output: Contribution to journal › Article
traveling ionospheric disturbances
selenides
Radiation
Electrodes
electrodes
Projects 2002 2023
Characterizing and Modeling Radiation Effects in Neuromorphic Computing Paradigm
Barnaby, H., Holbert, K., Kozicki, M. & Yu, S.
DOD: Defense Threat Reduction Agency (DTRA)
4/20/17 → 4/19/20
Project: Research project
Exploiting Nanomaterials for End-to-End Cybersecurity Solutions
7/1/16 → 12/31/18
Project: Research project
CES Manager Account: Consortium for Embedded Systems
Vrudhula, S., Candan, K., Lee, Y., Gupta, S., Barnaby, H., Huang, D., Shrivastava, A., Fainekos, G., Wu, C. & Yu, S.
INDUSTRY: Various Consortium Members
9/1/07 → 3/31/19
Project: Research project
Embedded systems
Managers
Data storage equipment
Threshold logic
Temporal logic