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Personal profile

Education/Academic qualification

PHD, Vanderbilt University

… → 2002

MS EE, Vanderbilt University

… → 1999

BA, University of California-Berkeley

… → 1992

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Research Output

Ionizing radiation tolerance of stacked Si3N4-SiO2 gate insulators for power MOSFETs

Muthuseenu, K., Barnaby, H. J., Patadia, A., Holbert, K. & Privat, A., Jan 2020, In : Microelectronics Reliability. 104, 113554.

Research output: Contribution to journalArticle

Open Access
  • 3 Scopus citations

    Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference

    Ye, Z., Liu, R., Barnaby, H. & Yu, S., May 22 2019, 2019 IEEE International Reliability Physics Symposium, IRPS 2019. Institute of Electrical and Electronics Engineers Inc., 8720490. (IEEE International Reliability Physics Symposium Proceedings; vol. 2019-March).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Monolithically Integrated RRAM- And CMOS-Based In-Memory Computing Optimizations for Efficient Deep Learning

    Yin, S., Seo, J. S., Kim, Y., Han, X., Barnaby, H., Yu, S., Luo, Y., He, W., Sun, X. & Kim, J. J., Nov 1 2019, In : IEEE Micro. 39, 6, p. 54-63 10 p., 8894568.

    Research output: Contribution to journalArticle

  • 4 Scopus citations