Engineering & Materials Science
Radiation
100%
Oxides
56%
Ionizing radiation
53%
Chalcogenides
52%
Data storage equipment
40%
Irradiation
39%
Radiation effects
39%
Metallizing
39%
Transistors
39%
Networks (circuits)
37%
Bipolar transistors
36%
Degradation
34%
Dosimetry
28%
Surface potential
24%
Hydrogen
23%
Defects
22%
Glass
21%
Gamma rays
21%
Silicon
20%
Ions
18%
Electric potential
18%
Protons
16%
Heavy ions
16%
Leakage currents
15%
Doping (additives)
15%
FinFET
13%
Thin films
12%
Analytical models
12%
Threshold voltage
12%
Proton irradiation
11%
Temperature
10%
RRAM
10%
Charge trapping
10%
Flip flop circuits
9%
Circuit simulation
9%
Particle accelerators
9%
Drain current
9%
Acoustic impedance
9%
Neutrons
9%
Operational amplifiers
9%
Sensors
8%
Silver
8%
Integrated circuits
8%
Radiation hardening
8%
Substrates
8%
Annealing
8%
Electrons
7%
Experiments
7%
Electrodes
7%
Ion bombardment
7%
Physics & Astronomy
dosage
83%
radiation
54%
bipolar transistors
31%
chalcogenides
31%
random access memory
29%
transistors
29%
oxides
28%
ionizing radiation
27%
CMOS
27%
junction transistors
26%
radiation effects
24%
traps
23%
irradiation
22%
simulation
20%
field effect transistors
20%
hydrogen
16%
defects
15%
traveling ionospheric disturbances
15%
isolation
14%
leakage
13%
damage
12%
electric potential
12%
glass
12%
gamma rays
11%
SOI (semiconductors)
11%
linear circuits
10%
sensors
10%
operational amplifiers
9%
silicon
9%
methodology
8%
heavy ions
8%
ions
8%
fins
8%
thin films
7%
protons
7%
threshold voltage
7%
radiation dosage
7%
metal oxide semiconductors
7%
fluence
7%
insulators
7%
aerospace environments
7%
low resistance
6%
analogs
6%
linear integrated circuits
6%
high resistance
6%
radiation hardening
6%
voltage controlled oscillators
6%