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The stability and reliability of mixed oxide-based thin film transistors under gamma irradiation
Terry Alford, A. Indluru, Rajitha N P Vemuri, Keith Holbert
- Materials Science and Engineering
- Mechanical and Aerospace Engineering
- Chemical Engineering
- Connection One (C1)
- Knowledge Enterprise (KE)
- Engineering of Matter, Transport and Energy, School for (IAFSE-SEMTE)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution