Study of pit formation in MBE grown GaP on misoriented Si

Engineering & Materials Science

• Molecular beam epitaxy 100%
• Atomic force microscopy 82%
• Multi-junction solar cells 52%
• Etching 34%
• Diffraction 34%
• Crystalline materials 33%
• Surface properties 32%
• X rays 29%
• Imaging techniques 24%

Physics & Astronomy

• atomic force microscopy 32%
• wafers 32%
• x ray diffraction 18%
• etching 16%
• solar cells 15%
• high resolution 13%

Chemical Compounds

• Atomic Force Microscopy 34%
• Surface 20%
• Etching 19%
• Solar Cell 18%
• Alloy 15%
• Reduction 9%