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Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits
Jereme Neuendank, Matthew Spear, Trace Wallace, Donald Wilson, Jose Solano, Gedeon Irumva, Ivan Sanchez Esqueda, Hugh J. Barnaby, Lawrence T Clark, John Brunhaver, Marek Turowski, Esko Mikkola, David Hughart, Joshua Young, Jack Manuel, Sapan Agarwal, Bastiaan Vaandrager, Gyorgy Vizkelethy, Amos Gutierrez, James Trippe
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Scopus
citations