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Remote plasma enhanced chemical vapor deposition SiO
2
in silicon based nanostructures
D. K. Ferry
Solid State Electronics Research Center (CSSER)
Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
Research output
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2
in silicon based nanostructures'. Together they form a unique fingerprint.
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Engineering & Materials Science
Plasma enhanced chemical vapor deposition
100%
Nanostructures
86%
Oxides
60%
Silicon
55%
Surface roughness
23%
Plasmas
12%
Vapors
12%
Inversion layers
12%
Silicon oxides
10%
Gates (transistor)
10%
MOSFET devices
8%
Leakage currents
7%
Nucleation
7%
Silica
7%
Electrons
7%
Hot Temperature
6%
Oxidation
6%
Temperature
5%
Defects
4%
Gases
4%
Physics & Astronomy
vapor deposition
54%
oxides
43%
silicon
37%
depletion
12%
surface roughness
11%
roughness
11%
vapors
10%
silicon oxides
7%
metal oxide semiconductors
7%
coverings
6%
leakage
5%
inversions
5%
vapor phases
5%
field effect transistors
5%
silicon dioxide
5%
nucleation
5%
oxidation
5%
defects
3%
electrons
2%