Quantitative Determination of the Metastability of Flat Ag Overlayers on GaAs(110)

Hongbin Yu, C. S. Jiang, X. D. Wang, Qian Niu, C. K. Shih, Ph Ebert, J. M. White, J. M. White, C. K. Shih, J. M. White, Qian Niu, C. K. Shih, Zhenyu Zhang

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