Fingerprint
Dive into the research topics of 'Process independent gain measurement with low overhead via BIST/DUT co-design'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Process independent gain measurement with low overhead via BIST/DUT co-design
Jae Woong Jeong, Jennifer Kitchen, Sule Ozev
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5
Scopus
citations