Process independent gain measurement with low overhead via BIST/DUT co-design

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Built-in Self-Test (BIST) is essential, particularly for radio frequency (RF) devices where off-chip RF signal analysis is costly or in some cases, infeasible. Two major problems have made RF BIST elusive. First, process variations make the BIST circuit behavior hard to predict, limiting accuracy of measurements. Second, the overhead, particularly in terms of performance degradation, make RF BIST undesirable. In this paper, we address these two issues for RF BIST gain measurement. First, we show that by setting up relative gain measurements and carefully crafting the BIST methodology and the matching BIST circuit, the effect of process variations on measurement accuracy can be suppressed. Second, by co-designing the BIST circuit together with the device under test (DUT), performance impact can be eliminated or significantly reduced. To demonstrate the proposed approach, we design a low noise amplifier (LNA) as the DUT together with the BIST circuit. We also design a stand-alone LNA with the same specifications and manufacture these two circuits on the same die. We show that the LNA gain can be determined very accurately, using only DC measurements, and the performance impact of the BIST circuit is negligible.

Original languageEnglish (US)
Title of host publicationProceedings - 2016 IEEE 34th VLSI Test Symposium, VTS 2016
PublisherIEEE Computer Society
Volume2016-May
ISBN (Electronic)9781467384544
DOIs
StatePublished - May 23 2016
Event34th IEEE VLSI Test Symposium, VTS 2016 - Las Vegas, United States
Duration: Apr 25 2016Apr 27 2016

Other

Other34th IEEE VLSI Test Symposium, VTS 2016
CountryUnited States
CityLas Vegas
Period4/25/164/27/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications

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  • Cite this

    Jeong, J. W., Kitchen, J., & Ozev, S. (2016). Process independent gain measurement with low overhead via BIST/DUT co-design. In Proceedings - 2016 IEEE 34th VLSI Test Symposium, VTS 2016 (Vol. 2016-May). [7477284] IEEE Computer Society. https://doi.org/10.1109/VTS.2016.7477284