On the minimum number of beams needed to distinguish enantiomorphs in X‐ray and electron diffraction

John Spence, J. M. Zuo, M. O'Keeffe, K. Marthinsen, R. Hoier

Research output: Contribution to journalArticle

14 Scopus citations

Fingerprint Dive into the research topics of 'On the minimum number of beams needed to distinguish enantiomorphs in X‐ray and electron diffraction'. Together they form a unique fingerprint.