On the minimum number of beams needed to distinguish enantiomorphs in X‐ray and electron diffraction

John Spence, J. M. Zuo, M. O'Keeffe, K. Marthinsen, R. Hoier

Research output: Contribution to journalArticlepeer-review

23 Scopus citations
Original languageEnglish (US)
Pages (from-to)647-650
Number of pages4
JournalActa Crystallographica Section A: Foundations of Crystallography
Volume50
Issue number5
DOIs
StatePublished - 1994

ASJC Scopus subject areas

  • Structural Biology

Cite this