Numerical study on effects of random dopant fluctuation in double gate tunneling FET

Ying Zhu, Yun Ye, Yu Cao, Jin He, Aixi Zhang, Hongyu He, Hao Wang, Chenyue Ma, Yue Hu, Mansun Chan, Xiaoan Zhu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

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Engineering & Materials Science