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Large electric-field induced electron drift velocity observed in an In xGa1-xAs-based p-i-n semiconductor nanostructure at T=300 K
W. Liang, Kong-Thon Tsen, D. K. Ferry, Meng Chyi Wu, Chong Long Ho, Wen Jeng Ho
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations