Implementation of surface roughness scattering in Monte Carlo modeling of thin SOI MOSFETs using the effective potential

Stephen M. Ramey, David K. Ferry

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Fingerprint

Dive into the research topics of 'Implementation of surface roughness scattering in Monte Carlo modeling of thin SOI MOSFETs using the effective potential'. Together they form a unique fingerprint.

Engineering & Materials Science