High-resolution transmission electron microscopy analysis of bulk nanograined silicon processed by high-pressure torsion

Yuta Fukushima, Yoshifumi Ikoma, Kaveh Edalati, Bumsoo Chon, David Smith, Zenji Horita

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We report on high-resolution transmission electron microscopy observations of bulk nanograined silicon processed by severe plastic deformation through high-pressure torsion (HPT). Single crystalline Si(100) was subjected to HPT processing under a nominal pressure of 24 GPa at room temperature. The HPT-processed samples contained lattice defects such as dislocations and nanotwins in diamond-cubic Si-I, and metastable phases such as body-centered-cubic Si-III and hexagonal-diamond Si-IV. The grain size ranged from several nanometers up to several tens of nanometers. Subsequent annealing at 873 K led to the phase transformation to Si-I. No appreciable grain coarsening occurred after annealing while dislocations and nanotwins remained in the Si-I nanograins. The Si-I nanograin structure was retained even after annealing for 12 h.

Original languageEnglish (US)
Pages (from-to)163-168
Number of pages6
JournalMaterials Characterization
Volume129
DOIs
StatePublished - Jul 1 2017

Fingerprint

Silicon
High resolution transmission electron microscopy
Torsional stress
torsion
transmission electron microscopy
Diamond
annealing
high resolution
silicon
Annealing
diamonds
Diamonds
plastic deformation
phase transformations
Metastable phases
Crystal defects
Coarsening
grain size
Dislocations (crystals)
Plastic deformation

Keywords

  • High-pressure torsion
  • HRTEM
  • Lattice defects
  • Metastable phase
  • Phase transformation
  • Severe plastic deformation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

High-resolution transmission electron microscopy analysis of bulk nanograined silicon processed by high-pressure torsion. / Fukushima, Yuta; Ikoma, Yoshifumi; Edalati, Kaveh; Chon, Bumsoo; Smith, David; Horita, Zenji.

In: Materials Characterization, Vol. 129, 01.07.2017, p. 163-168.

Research output: Contribution to journalArticle

Fukushima, Yuta ; Ikoma, Yoshifumi ; Edalati, Kaveh ; Chon, Bumsoo ; Smith, David ; Horita, Zenji. / High-resolution transmission electron microscopy analysis of bulk nanograined silicon processed by high-pressure torsion. In: Materials Characterization. 2017 ; Vol. 129. pp. 163-168.
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