High-resolution transmission electron microscopy analysis of bulk nanograined silicon processed by high-pressure torsion

Engineering & Materials Science

• High resolution transmission electron microscopy 100%
• Torsional stress 61%
• Silicon 48%
• Annealing 45%
• Diamonds 30%
• Metastable phases 24%
• Crystal defects 24%
• Coarsening 18%
• Crystalline materials 16%
• Phase transitions 15%
• Plastic deformation 13%
• Temperature 6%

Physics & Astronomy

• torsion 59%
• transmission electron microscopy 40%
• high resolution 37%
• annealing 36%
• silicon 32%
• diamonds 32%
• phase transformations 17%
• plastic deformation 17%
• grain size 15%
• room temperature 11%
• defects 11%

Chemical Compounds

• Torsion 62%
• Annealing 48%
• Metastable Phase 26%
• Plastic Deformation 25%
• Body-Centered Cubic Crystal System 24%
• Crystal Defect 23%
• Grain Size 19%
• Pressure 11%
• Ambient Reaction Temperature 11%