Experimental study of plane electrode thickness scaling for 3D vertical resistive random access memory

Hong Yu Chen, Shimeng Yu, Bin Gao, Rui Liu, Zizhen Jiang, Yexin Deng, Bing Chen, Jinfeng Kang, H. S. Philip Wong

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Fingerprint

Dive into the research topics of 'Experimental study of plane electrode thickness scaling for 3D vertical resistive random access memory'. Together they form a unique fingerprint.

Engineering & Materials Science

Medicine & Life Sciences

Chemical Compounds