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Experimental low-voltage point-projection microscopy and its possibilities
John Spence, W. Qian, A. J. Melmed
Physics
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peer-review
39
Scopus citations
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Engineering & Materials Science
Carbon films
100%
Radiation damage
96%
Aberrations
84%
Microscopic examination
69%
Image resolution
68%
Luminance
61%
Electron microscopes
60%
Thin films
60%
Electric potential
33%
Temperature
25%
Medicine & Life Sciences
Carbon
63%
Microscopy
53%
Electrons
51%
Radiation
48%
Temperature
46%
Physics & Astronomy
low voltage
62%
projection
50%
microscopy
44%
radiation damage
22%
aberration
19%
brightness
18%
electron microscopes
16%
carbon
14%
high resolution
12%
Chemical Compounds
Electron Particle
34%
Liquid Film
30%
Carbon Atom
30%
Application
20%