Experimental low-voltage point-projection microscopy and its possibilities

John Spence, W. Qian, A. J. Melmed

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.

Original languageEnglish (US)
Pages (from-to)473-477
Number of pages5
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - 1993

Fingerprint

Carbon films
Radiation damage
Image resolution
Aberrations
low voltage
Luminance
Microscopic examination
Electron microscopes
projection
microscopy
Thin films
Electric potential
radiation damage
Temperature
aberration
brightness
electron microscopes
carbon
high resolution

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Experimental low-voltage point-projection microscopy and its possibilities. / Spence, John; Qian, W.; Melmed, A. J.

In: Ultramicroscopy, Vol. 52, No. 3-4, 1993, p. 473-477.

Research output: Contribution to journalArticle

Spence, John ; Qian, W. ; Melmed, A. J. / Experimental low-voltage point-projection microscopy and its possibilities. In: Ultramicroscopy. 1993 ; Vol. 52, No. 3-4. pp. 473-477.
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