Experimental low-voltage point-projection microscopy and its possibilities

John Spence, W. Qian, A. J. Melmed

Research output: Contribution to journalArticle

34 Scopus citations

Abstract

The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.

Original languageEnglish (US)
Pages (from-to)473-477
Number of pages5
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - Dec 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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