TY - JOUR
T1 - Experimental low-voltage point-projection microscopy and its possibilities
AU - Spence, John
AU - Qian, W.
AU - Melmed, A. J.
N1 - Funding Information:
We are grateful to Dr. M. Scheinfein for many useful discussions. Supported by NSF award DMR91-16362.
PY - 1993/12
Y1 - 1993/12
N2 - The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.
AB - The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.
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U2 - 10.1016/0304-3991(93)90063-4
DO - 10.1016/0304-3991(93)90063-4
M3 - Article
AN - SCOPUS:0027715253
SN - 0304-3991
VL - 52
SP - 473
EP - 477
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 3-4
ER -