Estimation and verification of radiation induced not and Nit energy distribution using combined bipolar and MOS characterization methods in gated bipolar devices

X. J. Chen, Hugh Barnaby, R. L. Pease, R. D. Schrimpf, D. Platteter, M. Shaneyfelt, B. Vermeire

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Fingerprint

Dive into the research topics of 'Estimation and verification of radiation induced not and Nit energy distribution using combined bipolar and MOS characterization methods in gated bipolar devices'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science