@article{dc0168895b1449caa0072fcc43d0665a,
title = "Estimation and verification of radiation induced not and Nit energy distribution using combined bipolar and MOS characterization methods in gated bipolar devices",
abstract = "Complementary bipolar and MOS characterization techniques, specifically the gate sweep (GS) and sub-threshold sweep (SS), are used to estimate the radiation induced oxide charge (Not) and interface trap (N it) buildup in gated bipolar test devices. The gate sweep and sub-threshold sweep data from recent TID testing of gated lateral PNP devices suggests an asymmetric energy distribution of interface traps after ionizing radiation exposure. Charge pumping (CP) experiments were done on the test devices to estimate the energy distribution of interface traps induced by radiation. The CP results are used in this paper to confirm the analytical findings from the GS and SS techniques and solidify the use of the complementary method as a simple way of determining radiation induced interface trap distribution in gated bipolar devices.",
keywords = "BJT, Charge pumping, ELDRS, Interface traps, TID",
author = "Chen, {X. J.} and Hugh Barnaby and Pease, {R. L.} and Schrimpf, {R. D.} and D. Platteter and M. Shaneyfelt and B. Vermeire",
note = "Funding Information: Manuscript received July 8, 2005; revised August 26, 2005. This work was supported by the Defense Threat Reduction Agency and the U.S. Department of Energy. Sandia is a multi-program laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy{\textquoteright}s National Nuclear Security Administration under Contract DE-AC04-94AL85000. X. J. Chen and H. J. Barnaby are with the Department of Electrical Engineering, Arizona State University, Tempe, AZ 85287-5706 USA (e-mail: j.chen@asu.edu; hbarnaby@asu.edu; . R. L. Pease is with RLP Research, Los Lunas, NM 87031 USA (e-mail: rpease@mrcmicroe.com). R. D. Schrimpf is with Vanderbilt University, Nashville, TN 37232 USA (e-mail: ron.schrimpf@vanderbilt.edu). D. Platteter is with the NAVSEA Crane, Crane, IN 47522 USA (e-mail: plat-teter@atd.crane.navy.mil). M. Shaneyfelt is with Sandia National Laboratories, Albuquerque, NM 87185-1083 USA (e-mail: shaneyfelt@sandia.gov). B. Vermeire is with Wintech Programs, Arizona State University, Tempe, AZ 85287-8406 USA (e-mail: Bert.Vermeire@asu.edu). Digital Object Identifier 10.1109/TNS.2005.860669",
year = "2005",
month = dec,
doi = "10.1109/TNS.2005.860669",
language = "English (US)",
volume = "52",
pages = "2245--2251",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}