Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

S. Perez, L. Dusseau, Yago Gonzalez Velo, J. R. Vaillé, J. Boch, F. Saigné, F. Bezerra, R. Ecoffet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

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