@inproceedings{a225974def0243b886d798c61da4d4db,
title = "Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier",
abstract = "The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with 60Co source is investigated. The positive input current and the output voltage present an erratic behavior, that may differ from sample to sample. Circuit analysis is conducted in order to determine the degradation mechanisms.",
keywords = "Co, Current feedback amplifier, Total Ionizing Dose, bipolar ICs, current conveyor",
author = "S. Perez and L. Dusseau and {Gonzalez Velo}, Yago and Vaill{\'e}, {J. R.} and J. Boch and F. Saign{\'e} and F. Bezerra and R. Ecoffet",
year = "2011",
month = dec,
day = "1",
doi = "10.1109/RADECS.2011.6131407",
language = "English (US)",
isbn = "9781457705878",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "270--273",
booktitle = "RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings",
note = "12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 ; Conference date: 19-09-2011 Through 23-09-2011",
}