Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

S. Perez, L. Dusseau, Yago Gonzalez Velo, J. R. Vaillé, J. Boch, F. Saigné, F. Bezerra, R. Ecoffet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with 60Co source is investigated. The positive input current and the output voltage present an erratic behavior, that may differ from sample to sample. Circuit analysis is conducted in order to determine the degradation mechanisms.

Original languageEnglish (US)
Title of host publicationRADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
Pages270-273
Number of pages4
DOIs
StatePublished - Dec 1 2011
Event12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain
Duration: Sep 19 2011Sep 23 2011

Other

Other12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
CountrySpain
CitySevilla
Period9/19/119/23/11

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Keywords

  • Co
  • bipolar ICs
  • current conveyor
  • Current feedback amplifier
  • Total Ionizing Dose

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

Cite this

Perez, S., Dusseau, L., Gonzalez Velo, Y., Vaillé, J. R., Boch, J., Saigné, F., Bezerra, F., & Ecoffet, R. (2011). Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings (pp. 270-273). [6131407] https://doi.org/10.1109/RADECS.2011.6131407