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Dive into the research topics of 'Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO 2 (ZrO2) layers sandwiched between thicker SiO2 layers'. Together they form a unique fingerprint.- Sort by
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C. L. Hinkle, C. Fulton, R. J. Nemanich, G. Lucovsky
Research output: Contribution to journal › Conference article › peer-review