Electrochemical nanoimprinting of silicon: A direct patterning approach

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Soft-lithography and nanoimprinting lithography have been critical in manufacturing 3D features with sub-20 nm resolution onto polymeric materials which have often been employed for producing micro and nanoscale optical materials and surfaces. However, methods for transferring 3D polymeric patterns (i.e. mask) into silicon have relied upon the etch selectivity of the mask pattern during reactive etching, which in turn limits resolution, aspect-ratio and surface roughness. This paper demonstrates an electrochemical nanoimprinting process for single-crystal semiconductors for directly etching 3D features into silicon wafers. It is shown that stamps made of porous catalysts play a critical role in enabling diffusion of chemical species during imprinting which, in turn, allows for morphology control of imprinted silicon features with sub-20 nm resolution in 3D. This process delivers mirror surface finish (RMS < 5 nm), low-defect density, and large-area patterning (>1 cm2) in a single imprinting operation. Further, it outperforms the resolution and scalability of leading serial (e.g. FIB, electron beam) and parallel (e.g. gray-scale lithography) methods altogether, allowing for fast replication of patterns onto hard materials from a soft mold. This technique bypasses the need for dry etching and is potentially compatible with roll-to-roll platforms, amorphous and poly silicon and III-V semiconductors. In turn, it may pave the way for mold replication onto hard molds and the manufacturing of complex objects for infrared optics.

    Original languageEnglish (US)
    Title of host publicationTechConnect Briefs 2018 - Informatics, Electronics and Microsystems
    EditorsMatthew Laudon, Fiona Case, Bart Romanowicz, Fiona Case
    PublisherTechConnect
    Pages217-219
    Number of pages3
    Volume4
    ISBN (Electronic)9780998878256
    StatePublished - Jan 1 2018
    Event11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference - Anaheim, United States
    Duration: May 13 2018May 16 2018

    Other

    Other11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference
    CountryUnited States
    CityAnaheim
    Period5/13/185/16/18

    Fingerprint

    Silicon
    Lithography
    Masks
    Etching
    Dry etching
    Optical materials
    Molds
    Silicon wafers
    Scalability
    Aspect ratio
    Electron beams
    Optics
    Mirrors
    Surface roughness
    Single crystals
    Semiconductor materials
    Infrared radiation
    Catalysts
    Polymers

    Keywords

    • 3D nanostructures
    • MACE
    • Metal-assisted chemical etching
    • Nanoimprinting
    • Scalable nanomanufacturing
    • Wet etching

    ASJC Scopus subject areas

    • Materials Science(all)

    Cite this

    Azeredo, B. (2018). Electrochemical nanoimprinting of silicon: A direct patterning approach. In M. Laudon, F. Case, B. Romanowicz, & F. Case (Eds.), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems (Vol. 4, pp. 217-219). TechConnect.

    Electrochemical nanoimprinting of silicon : A direct patterning approach. / Azeredo, Bruno.

    TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. ed. / Matthew Laudon; Fiona Case; Bart Romanowicz; Fiona Case. Vol. 4 TechConnect, 2018. p. 217-219.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Azeredo, B 2018, Electrochemical nanoimprinting of silicon: A direct patterning approach. in M Laudon, F Case, B Romanowicz & F Case (eds), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. vol. 4, TechConnect, pp. 217-219, 11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference, Anaheim, United States, 5/13/18.
    Azeredo B. Electrochemical nanoimprinting of silicon: A direct patterning approach. In Laudon M, Case F, Romanowicz B, Case F, editors, TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. Vol. 4. TechConnect. 2018. p. 217-219
    Azeredo, Bruno. / Electrochemical nanoimprinting of silicon : A direct patterning approach. TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. editor / Matthew Laudon ; Fiona Case ; Bart Romanowicz ; Fiona Case. Vol. 4 TechConnect, 2018. pp. 217-219
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