Electric-field-driven degradation in off-state step-stressed AlGaN/GaN high-electron mobility transistors

Chih Yang Chang, E. A. Douglas, Jinhyung Kim, Liu Lu, Chien Fong Lo, Byung Hwan Chu, D. J. Cheney, B. P. Gila, F. Ren, G. D. Via, David A. Cullen, Lin Zhou, David Smith, Soohwan Jang, S. J. Pearton

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Engineering & Materials Science

Chemical Compounds