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Dive into the research topics of 'Electric-field-driven degradation in off-state step-stressed AlGaN/GaN high-electron mobility transistors'. Together they form a unique fingerprint.- Sort by
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Chih Yang Chang, E. A. Douglas, Jinhyung Kim, Liu Lu, Chien Fong Lo, Byung Hwan Chu, D. J. Cheney, B. P. Gila, F. Ren, G. D. Via, David A. Cullen, Lin Zhou, David Smith, Soohwan Jang, S. J. Pearton
Research output: Contribution to journal › Article › peer-review