Crystal structure, electronic band structure, electrical resistivity and scanning probe microscopy studies of layered compound MoOCl₂

Engineering & Materials Science

• Scanning tunneling microscopy 100%
• Scanning probe microscopy 90%
• Band structure 78%
• Crystal structure 72%
• Atomic force microscopy 71%
• Magnetoresistance 44%
• Electronic structure 41%
• Stacking faults 40%
• Single crystals 32%
• X ray diffraction 27%
• Luminance 27%
• Metals 18%

Chemical Compounds

• Scanning Probe Microscopy 69%
• Scanning Tunneling Microscopy 57%
• Electronic Band Structure 56%
• Atomic Force Microscopy 44%
• Tight-Binding Method 42%
• Stacking Fault 38%
• Crystal Structure 28%
• Electronic State 20%
• Single Crystal X-Ray Diffraction 20%
• Metal 12%
• Surface 8%