The structure of MoOCl2 was determined by single crystal X-ray diffraction, and the electronic structure of MoOCl2 was calculated by the extended Hückel tight binding method. The electrical resistivity and magnetoresistivity measurements of MoOCl2 were performed, and the surfaces of MoOCl2 samples were characterized by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). MoOCl2 has stacking faults in crystal structure and is a metal. The STM and AFM images of MoOCl2 differ substantially in brightness pattern.
|Original language||English (US)|
|Number of pages||6|
|Journal||New Journal of Chemistry|
|State||Published - Jan 1 1996|
ASJC Scopus subject areas
- Materials Chemistry