Crystal structure, electronic band structure, electrical resistivity and scanning probe microscopy studies of layered compound MoOCl₂

The structure of MoOCl₂ was determined by single crystal X-ray diffraction, and the electronic structure of MoOCl₂ was calculated by the extended Hückel tight binding method. The electrical resistivity and magnetoresistivity measurements of MoOCl₂ were performed, and the surfaces of MoOCl₂ samples were characterized by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). MoOCl₂ has stacking faults in crystal structure and is a metal. The STM and AFM images of MoOCl₂ differ substantially in brightness pattern.