Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Andrew M. Levine; Guanhong Bu; Sankarsan Biswas; Esther H.R. Tsai; Adam B. Braunschweig; Brent L. Nannenga

doi:10.1039/d0cc00119h

Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Andrew M. Levine, Guanhong Bu, Sankarsan Biswas, Esther H.R. Tsai, Adam B. Braunschweig, Brent L. Nannenga

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

Original language	English (US)
Pages (from-to)	4204-4207
Number of pages	4
Journal	Chemical Communications
Volume	56
Issue number	30
DOIs	https://doi.org/10.1039/d0cc00119h
State	Published - Apr 18 2020

ASJC Scopus subject areas

Catalysis
Electronic, Optical and Magnetic Materials
Ceramics and Composites
General Chemistry
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1039/d0cc00119h

Cite this

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title = "Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering",

abstract = "We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.",

author = "Levine, {Andrew M.} and Guanhong Bu and Sankarsan Biswas and Tsai, {Esther H.R.} and Braunschweig, {Adam B.} and Nannenga, {Brent L.}",

note = "Funding Information: AL thanks the NSF CREST Center for Interface Design and Engineered Assembly of Low Dimensional systems (IDEALS), NSF grant number HRD1547830. AB and BLN thank the Air Force Office of Scientific Research (FA9550-19-1-0220 and FA9550-18-1-0012, respectively). AB also thanks NSF CHE, grant number CHE-1610755. We thank Marc Messerschmidt, Michael Martynowycz and Tim Gruene for helpful discussions on electron diffraction data processing and refinement. We acknowledge the use of the Titan Krios within the Eyring Materials Center at Arizona State University and for NSF grant 1531991 for the funding of this instrument. This research used beamline 12-ID SMI of the National Synchrotron Light Source II (NSLS-II) and the Center for Functional Nanomaterials (CFN), both of which are U.S. Department of Energy (DOE) Office of Science User Facilities operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. We thank Guillaume Freychet and Mikhail Zhernenkov for their assistance performing experiments at the beamline. Publisher Copyright: This journal is {\textcopyright} The Royal Society of Chemistry.",

year = "2020",

month = apr,

day = "18",

doi = "10.1039/d0cc00119h",

language = "English (US)",

volume = "56",

pages = "4204--4207",

journal = "Chemical Communications",

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publisher = "Royal Society of Chemistry",

number = "30",

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TY - JOUR

T1 - Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

AU - Levine, Andrew M.

AU - Bu, Guanhong

AU - Biswas, Sankarsan

AU - Tsai, Esther H.R.

AU - Braunschweig, Adam B.

AU - Nannenga, Brent L.

N1 - Funding Information: AL thanks the NSF CREST Center for Interface Design and Engineered Assembly of Low Dimensional systems (IDEALS), NSF grant number HRD1547830. AB and BLN thank the Air Force Office of Scientific Research (FA9550-19-1-0220 and FA9550-18-1-0012, respectively). AB also thanks NSF CHE, grant number CHE-1610755. We thank Marc Messerschmidt, Michael Martynowycz and Tim Gruene for helpful discussions on electron diffraction data processing and refinement. We acknowledge the use of the Titan Krios within the Eyring Materials Center at Arizona State University and for NSF grant 1531991 for the funding of this instrument. This research used beamline 12-ID SMI of the National Synchrotron Light Source II (NSLS-II) and the Center for Functional Nanomaterials (CFN), both of which are U.S. Department of Energy (DOE) Office of Science User Facilities operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. We thank Guillaume Freychet and Mikhail Zhernenkov for their assistance performing experiments at the beamline. Publisher Copyright: This journal is © The Royal Society of Chemistry.

PY - 2020/4/18

Y1 - 2020/4/18

N2 - We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

AB - We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

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DO - 10.1039/d0cc00119h

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JO - Chemical Communications

JF - Chemical Communications

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ER -

Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Abstract

ASJC Scopus subject areas

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CCDC 1963922: Experimental Crystal Structure Determination

CCDC 1963919: Experimental Crystal Structure Determination

CCDC 1963921: Experimental Crystal Structure Determination

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Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Abstract

ASJC Scopus subject areas

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Datasets

CCDC 1963922: Experimental Crystal Structure Determination

CCDC 1963919: Experimental Crystal Structure Determination

CCDC 1963921: Experimental Crystal Structure Determination

Cite this