Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Andrew M. Levine, Guanhong Bu, Sankarsan Biswas, Esther H.R. Tsai, Adam B. Braunschweig, Brent L. Nannenga

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

Original languageEnglish (US)
Pages (from-to)4204-4207
Number of pages4
JournalChemical Communications
Volume56
Issue number30
DOIs
StatePublished - Apr 18 2020
Externally publishedYes

ASJC Scopus subject areas

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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