Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Andrew M. Levine, Guanhong Bu, Sankarsan Biswas, Esther H.R. Tsai, Adam B. Braunschweig, Brent L. Nannenga

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

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