Circuit-level impact of a-Si:H thin-film-transistor degradation effects

David Allee, Lawrence T. Clark, Bryan D. Vogt, Rahul Shringarpure, Sameer M. Venugopal, Shrinivas Gopalan Uppili, Korhan Kaftanoglu, Hemanth Shivalingaiah, Zi P. Li, J. J Ravindra Fernando, Edward J. Bawolek, Shawn M. O'Rourke