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Characterization of enhanced low dose rate sensitivity (ELDRS) effects using gated lateral PNP transistor structures
Ronald L. Pease, Dale G. Platteter, G. W. Dunham, J. E. Seiler, H. J. Barnaby, R. D. Schrimpf, Marty R. Shaneyfelt, M. C. Maher, R. N. Nowlin
Research output: Contribution to journal › Article › peer-review
75
Scopus
citations