Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation

Y. Gonzalez Velo, J. Boch, N. J.H. Roche, S. Pérez, J. R. Vaillé, L. Dusseau, F. Saigné, E. Lorfèvre, R. D. Schrimpf, C. Chatry, A. Canals

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Accelerated test techniques are needed in order to qualify bipolar devices intended for use in low dose rate environments. Indeed, low dose rate is known to enhance degradation of bipolar devices. Moreover, the bias of microcircuits is known to play a significant role in device degradation. In this work, bipolar microcircuits are irradiated with different bias configurations during the irradiation. It is shown that the bias configuration leading to the worst-case degradation is dose-rate dependent. Moreover, if a time-saving evaluation technique based on dose-rate switching is to be used, the effect of bias has to investigated. Good agreement is found between the predictive curve obtained with the switched dose-rate technique and the low dose rate data.

Original languageEnglish (US)
Title of host publication2009 European Conference on Radiation and Its Effects on Components and Systems
Subtitle of host publication10th RADECS Conference, RADECS 2009
Pages308-312
Number of pages5
DOIs
StatePublished - Dec 1 2009
Event2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 - Bruges, Belgium
Duration: Sep 14 2009Sep 18 2009

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
CountryBelgium
CityBruges
Period9/14/099/18/09

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Keywords

  • Accelerated Test Technique
  • Bipolar Technology
  • Enhanced Low Dose Rate Sensitivity (ELDRS)
  • Total Dose
  • dose rate

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

Cite this

Velo, Y. G., Boch, J., Roche, N. J. H., Pérez, S., Vaillé, J. R., Dusseau, L., Saigné, F., Lorfèvre, E., Schrimpf, R. D., Chatry, C., & Canals, A. (2009). Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. In 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009 (pp. 308-312). [5994665] (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). https://doi.org/10.1109/RADECS.2009.5994665