@inproceedings{e0edc0b7afa54c06b091689a60b5860a,
title = "Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation",
abstract = "Accelerated test techniques are needed in order to qualify bipolar devices intended for use in low dose rate environments. Indeed, low dose rate is known to enhance degradation of bipolar devices. Moreover, the bias of microcircuits is known to play a significant role in device degradation. In this work, bipolar microcircuits are irradiated with different bias configurations during the irradiation. It is shown that the bias configuration leading to the worst-case degradation is dose-rate dependent. Moreover, if a time-saving evaluation technique based on dose-rate switching is to be used, the effect of bias has to investigated. Good agreement is found between the predictive curve obtained with the switched dose-rate technique and the low dose rate data.",
keywords = "Accelerated Test Technique, Bipolar Technology, Enhanced Low Dose Rate Sensitivity (ELDRS), Total Dose, dose rate",
author = "Velo, {Y. Gonzalez} and J. Boch and Roche, {N. J.H.} and S. P{\'e}rez and Vaill{\'e}, {J. R.} and L. Dusseau and F. Saign{\'e} and E. Lorf{\`e}vre and Schrimpf, {R. D.} and C. Chatry and A. Canals",
year = "2009",
doi = "10.1109/RADECS.2009.5994665",
language = "English (US)",
isbn = "9781457704932",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "308--312",
booktitle = "2009 European Conference on Radiation and Its Effects on Components and Systems",
note = "2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 ; Conference date: 14-09-2009 Through 18-09-2009",
}