Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation

Yago Gonzalez Velo, J. Boch, N. J.H. Roche, S. Pérez, J. R. Vaillé, L. Dusseau, F. Saigné, E. Lorfèvre, R. D. Schrimpf, C. Chatry, A. Canals

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Accelerated test techniques are needed in order to qualify bipolar devices intended for use in low dose rate environments. Indeed, low dose rate is known to enhance degradation of bipolar devices. Moreover, the bias of microcircuits is known to play a significant role in device degradation. In this work, bipolar microcircuits are irradiated with different bias configurations during the irradiation. It is shown that the bias configuration leading to the worst-case degradation is dose-rate dependent. Moreover, if a time-saving evaluation technique based on dose-rate switching is to be used, the effect of bias has to investigated. Good agreement is found between the predictive curve obtained with the switched dose-rate technique and the low dose rate data.

Original languageEnglish (US)
Title of host publication2009 European Conference on Radiation and Its Effects on Components and Systems
Subtitle of host publication10th RADECS Conference, RADECS 2009
Pages308-312
Number of pages5
DOIs
StatePublished - Dec 1 2009
Externally publishedYes
Event2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 - Bruges, Belgium
Duration: Sep 14 2009Sep 18 2009

Other

Other2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
CountryBelgium
CityBruges
Period9/14/099/18/09

Fingerprint

microelectronics
Dosimetry
Irradiation
degradation
Degradation
dosage
irradiation
configurations
evaluation
curves

Keywords

  • Accelerated Test Technique
  • Bipolar Technology
  • dose rate
  • Enhanced Low Dose Rate Sensitivity (ELDRS)
  • Total Dose

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

Cite this

Gonzalez Velo, Y., Boch, J., Roche, N. J. H., Pérez, S., Vaillé, J. R., Dusseau, L., ... Canals, A. (2009). Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. In 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009 (pp. 308-312). [5994665] https://doi.org/10.1109/RADECS.2009.5994665

Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. / Gonzalez Velo, Yago; Boch, J.; Roche, N. J.H.; Pérez, S.; Vaillé, J. R.; Dusseau, L.; Saigné, F.; Lorfèvre, E.; Schrimpf, R. D.; Chatry, C.; Canals, A.

2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009. 2009. p. 308-312 5994665.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gonzalez Velo, Y, Boch, J, Roche, NJH, Pérez, S, Vaillé, JR, Dusseau, L, Saigné, F, Lorfèvre, E, Schrimpf, RD, Chatry, C & Canals, A 2009, Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. in 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009., 5994665, pp. 308-312, 2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009, Bruges, Belgium, 9/14/09. https://doi.org/10.1109/RADECS.2009.5994665
Gonzalez Velo Y, Boch J, Roche NJH, Pérez S, Vaillé JR, Dusseau L et al. Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. In 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009. 2009. p. 308-312. 5994665 https://doi.org/10.1109/RADECS.2009.5994665
Gonzalez Velo, Yago ; Boch, J. ; Roche, N. J.H. ; Pérez, S. ; Vaillé, J. R. ; Dusseau, L. ; Saigné, F. ; Lorfèvre, E. ; Schrimpf, R. D. ; Chatry, C. ; Canals, A. / Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation. 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009. 2009. pp. 308-312
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