Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation

Y. Gonzalez Velo, J. Boch, N. J.H. Roche, S. Pérez, J. R. Vaillé, L. Dusseau, F. Saigné, E. Lorfèvre, R. D. Schrimpf, C. Chatry, A. Canals

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution