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A hierarchical modeling approach to accelerated degradation testing data analysis: A case study
Rong Pan
, Taeho Crispin
Computer Science and Engineering
Industrial, Systems and Operations Engineering
Computing and Augmented Intelligence, School of (IAFSE-SCAI)
Research output
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Contribution to journal
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Article
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peer-review
46
Scopus citations
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Dive into the research topics of 'A hierarchical modeling approach to accelerated degradation testing data analysis: A case study'. Together they form a unique fingerprint.
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Business & Economics
Degradation
100%
Testing
82%
Modeling
57%
Maximum Likelihood Estimation
30%
Measurement Error
25%
Measuring System
24%
Random Coefficients
20%
Path Model
20%
Sequencing
18%
Temperature
15%
Simulation
10%
Engineering & Materials Science
Degradation
68%
Testing
50%
Light emitting diodes
32%
Maximum likelihood estimation
18%
Light sources
17%
DNA
16%
Measurement errors
16%
Temperature
6%