A hierarchical modeling approach to accelerated degradation testing data analysis: A case study

Rong Pan, Taeho Crispin

Research output: Contribution to journalArticle

32 Scopus citations

Abstract

In this case study, we investigate the degradation process of light-emitting diodes (LEDs), which is used as a light source in DNA sequencing machines. Accelerated degradation tests are applied by varying temperature and forward current, and the light outputs are measured by a computerized measuring system. A degradation path model, which connects to the LED function recommended in Mitsuo (1991), is used in describing the degradation process. We consider variations in both measurement errors and degradation paths among individual test units. It is demonstrated that the hierarchical modeling approach is flexible and powerful in modeling a complex degradation process with nonlinear function and random coefficient. After fitting the model by maximum likelihood estimation, the failure time distribution can be obtained by simulation.

Original languageEnglish (US)
Pages (from-to)229-237
Number of pages9
JournalQuality and Reliability Engineering International
Volume27
Issue number2
DOIs
StatePublished - Mar 1 2011

Keywords

  • LED lighting
  • accelerated degradation testing
  • mixed effect
  • nonlinear regression
  • reliability prediction
  • repeated measurement

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

Fingerprint Dive into the research topics of 'A hierarchical modeling approach to accelerated degradation testing data analysis: A case study'. Together they form a unique fingerprint.

  • Cite this