4D characterization of electromigration-induced damage of environmentally-benign

Physics & Astronomy

1. electromigration 100%
2. damage 60%
3. characterization 47%
4. solders 30%
5. tomography 21%
6. defects 18%
7. microstructure 11%
8. thermomigration 11%
9. x rays 10%
10. students 10%
11. simulators 9%
12. simulation 9%
13. supplements 8%
14. materials science 7%
15. current density 7%
16. predictions 7%
17. microelectronics 6%
18. voids 5%
19. metals 5%
20. atoms 5%
21. engineering 5%