4D characterization of electromigration-induced damage of environmentally-benign

Project: Research project

Project Details

Description

4D characterization of electromigration-induced damage of environmentally-benign 4D characterization of electromigration-induced damage of environmentally-benigninterconnects: X-ray tomography experiments and phase-field simulations Supplement: 4D characterization of electromigration-induced damage of environmentally-benign interconnects: X-ray tomography experiments and phase-field simulations
StatusFinished
Effective start/end date8/1/187/31/22

Funding

  • National Science Foundation (NSF): $527,194.00

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