• 1309 Citations
  • 18 h-Index
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Personal profile

Education/Academic qualification

PHD, University of California-San Diego

… → 2002

MS, University of California-San Diego

… → 1998

BS, Bogazici University

… → 1995

Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 7 Similar Profiles
Networks (circuits) Engineering & Materials Science
Built-in self test Engineering & Materials Science
Transceivers Engineering & Materials Science
Testing Engineering & Materials Science
Analog circuits Engineering & Materials Science
Costs Engineering & Materials Science
Specifications Engineering & Materials Science
Transmitters Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1996 2019

  • 1309 Citations
  • 18 h-Index
  • 105 Conference contribution
  • 51 Article
  • 1 Chapter
  • 1 Conference article
Built-in self test
Time measurement
Signal to noise ratio

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-field Calibration

Jeong, J. W., Kitchen, J. & Ozev, S., Jan 1 2019, (Accepted/In press) In : IEEE Design and Test.

Research output: Contribution to journalArticle

Built-in self test
Networks (circuits)
Polychlorinated biphenyls

A built-in self-test technique for transmitter-only systems

Shafiee, M., Kitchen, J. & Ozev, S., May 29 2018, Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. IEEE Computer Society, Vol. 2018-April. p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Built-in self test
Time measurement

Detection mechanisms for unauthorized wireless transmissions

Chang, D., Bhat, G., Ogras, U., Bakkaloglu, B. & Ozev, S., Nov 1 2018, In : ACM Transactions on Design Automation of Electronic Systems. 23, 6, 70.

Research output: Contribution to journalArticle

Computer hardware
Supply chains
Signal processing

Enabling fast process variation and fault simulation through macromodelling of analog components

Ince, M., Yilmaz, E. & Ozev, S., Jun 19 2018, 27th North Atlantic Test Workshop, NATW 2018. Institute of Electrical and Electronics Engineers Inc., p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fault Simulation
Process Variation
Variable frequency oscillators
Built-in self test
Built-in Self-test

Projects 2008 2020