Engineering & Materials Science
Built-in self test
100%
Networks (circuits)
96%
Analog circuits
65%
Transceivers
62%
Testing
61%
Costs
49%
Calibration
44%
Defects
38%
Specifications
38%
Computer hardware
36%
Transmitters
34%
Microprocessor chips
22%
Sensors
19%
Discrete Fourier transforms
19%
Signal systems
18%
Transistors
18%
Chemical sensors
17%
Integrated circuits
17%
Variable frequency oscillators
16%
Monitoring
15%
Clamping devices
14%
DC-DC converters
13%
Detectors
12%
Bandwidth
11%
Degradation
11%
Microfluidics
11%
Bit error rate
11%
Rails
10%
Electric power utilization
10%
Digital circuits
10%
Phase locked loops
10%
Electrostatic discharge
9%
Aging of materials
9%
Modulation
9%
Hardware security
9%
Accelerometers
9%
White noise
9%
Low noise amplifiers
9%
Vapors
8%
Orthogonal frequency division multiplexing
8%
System-on-chip
8%
Spectrum analysis
8%
Compliance
8%
Design for testability
8%
Compensation and Redress
8%
Analog integrated circuits
8%
Antennas
8%
Internet of things
8%
Voltage regulators
8%
Experiments
8%
Mathematics
Built-in Self-test
17%
Fault Simulation
13%
Testing
10%
Fault
10%
Analogue
10%
Adaptive Test
10%
Calibration
8%
Analog Circuits
7%
Radar
7%
Process Variation
6%
Simulation
6%
Phase Noise
6%
Hardware
6%
Angle of Arrival
5%
Phased Array
5%
Orthogonal Frequency Division multiplexing (OFDM)
5%
Drop out
5%