X-ray microscopy by phase-retrieval methods at the advanced light source

M. R. Howells, H. Chapman, S. Hau-Riege, H. He, S. Marchesini, John Spence, Uwe Weierstall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

We report our experiments in soft x-ray coherent diffraction leading to reconstructed images via phase retrieval methods. We describe the history and principles of the method and the technical systems we have used to implement it. The main requirement is to have a sufficiently isolated sample.

Original languageEnglish (US)
Title of host publicationJournal De Physique. IV : JP
EditorsJ. Susini, D. Joyeux, F. Polack
Pages557-561
Number of pages5
Volume104
StatePublished - Mar 2003
Event7th International Conference on X-Ray Microscopy - Grenoble, France
Duration: Jul 28 2002Aug 2 2002

Other

Other7th International Conference on X-Ray Microscopy
CountryFrance
CityGrenoble
Period7/28/028/2/02

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Howells, M. R., Chapman, H., Hau-Riege, S., He, H., Marchesini, S., Spence, J., & Weierstall, U. (2003). X-ray microscopy by phase-retrieval methods at the advanced light source. In J. Susini, D. Joyeux, & F. Polack (Eds.), Journal De Physique. IV : JP (Vol. 104, pp. 557-561)