Two-color-dual-beam-sweep particle image velocimetry

Michael M. Cui, Ronald Adrian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two-color-dual-beam-sweep particle image velocimetry (TCDBSPIV) systems are designed to overcome the difficulties in two-phase flow studies. The system can automatically take a large number of pictures to obtain statistical quantities for random phenomena analysis or to gain good temporal resolution to investigate nonstationary flows. Directional ambiguities in the images are also removed, leading to improved resolution and signal to noise ratio.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED
EditorsD.E. Stock, Y. Tsuji, M.W. Reeks, E.E. Michaelides, M. Gautam
Place of PublicationNew York, NY, United States
PublisherASME
Pages81
Number of pages1
Volume209
StatePublished - 1995
Externally publishedYes
EventProceedings of the 1995 ASME/JSME Fluids Engineering and Laser Anemometry Conference and Exhibition - Hilton Head, SC, USA
Duration: Aug 13 1995Aug 18 1995

Other

OtherProceedings of the 1995 ASME/JSME Fluids Engineering and Laser Anemometry Conference and Exhibition
CityHilton Head, SC, USA
Period8/13/958/18/95

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Cui, M. M., & Adrian, R. (1995). Two-color-dual-beam-sweep particle image velocimetry. In D. E. Stock, Y. Tsuji, M. W. Reeks, E. E. Michaelides, & M. Gautam (Eds.), American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED (Vol. 209, pp. 81). ASME.