Two-color-dual-beam-sweep particle image velocimetry

Michael M. Cui, Ronald Adrian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two-color-dual-beam-sweep particle image velocimetry (TCDBSPIV) systems are designed to overcome the difficulties in two-phase flow studies. The system can automatically take a large number of pictures to obtain statistical quantities for random phenomena analysis or to gain good temporal resolution to investigate nonstationary flows. Directional ambiguities in the images are also removed, leading to improved resolution and signal to noise ratio.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED
EditorsD.E. Stock, Y. Tsuji, M.W. Reeks, E.E. Michaelides, M. Gautam
Place of PublicationNew York, NY, United States
PublisherASME
Pages81
Number of pages1
Volume209
StatePublished - 1995
Externally publishedYes
EventProceedings of the 1995 ASME/JSME Fluids Engineering and Laser Anemometry Conference and Exhibition - Hilton Head, SC, USA
Duration: Aug 13 1995Aug 18 1995

Other

OtherProceedings of the 1995 ASME/JSME Fluids Engineering and Laser Anemometry Conference and Exhibition
CityHilton Head, SC, USA
Period8/13/958/18/95

Fingerprint

Two phase flow
Velocity measurement
Signal to noise ratio
Color

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Cui, M. M., & Adrian, R. (1995). Two-color-dual-beam-sweep particle image velocimetry. In D. E. Stock, Y. Tsuji, M. W. Reeks, E. E. Michaelides, & M. Gautam (Eds.), American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED (Vol. 209, pp. 81). New York, NY, United States: ASME.

Two-color-dual-beam-sweep particle image velocimetry. / Cui, Michael M.; Adrian, Ronald.

American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED. ed. / D.E. Stock; Y. Tsuji; M.W. Reeks; E.E. Michaelides; M. Gautam. Vol. 209 New York, NY, United States : ASME, 1995. p. 81.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cui, MM & Adrian, R 1995, Two-color-dual-beam-sweep particle image velocimetry. in DE Stock, Y Tsuji, MW Reeks, EE Michaelides & M Gautam (eds), American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED. vol. 209, ASME, New York, NY, United States, pp. 81, Proceedings of the 1995 ASME/JSME Fluids Engineering and Laser Anemometry Conference and Exhibition, Hilton Head, SC, USA, 8/13/95.
Cui MM, Adrian R. Two-color-dual-beam-sweep particle image velocimetry. In Stock DE, Tsuji Y, Reeks MW, Michaelides EE, Gautam M, editors, American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED. Vol. 209. New York, NY, United States: ASME. 1995. p. 81
Cui, Michael M. ; Adrian, Ronald. / Two-color-dual-beam-sweep particle image velocimetry. American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED. editor / D.E. Stock ; Y. Tsuji ; M.W. Reeks ; E.E. Michaelides ; M. Gautam. Vol. 209 New York, NY, United States : ASME, 1995. pp. 81
@inproceedings{579d75463fac4ea19155272132ac13d3,
title = "Two-color-dual-beam-sweep particle image velocimetry",
abstract = "Two-color-dual-beam-sweep particle image velocimetry (TCDBSPIV) systems are designed to overcome the difficulties in two-phase flow studies. The system can automatically take a large number of pictures to obtain statistical quantities for random phenomena analysis or to gain good temporal resolution to investigate nonstationary flows. Directional ambiguities in the images are also removed, leading to improved resolution and signal to noise ratio.",
author = "Cui, {Michael M.} and Ronald Adrian",
year = "1995",
language = "English (US)",
volume = "209",
pages = "81",
editor = "D.E. Stock and Y. Tsuji and M.W. Reeks and E.E. Michaelides and M. Gautam",
booktitle = "American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED",
publisher = "ASME",

}

TY - GEN

T1 - Two-color-dual-beam-sweep particle image velocimetry

AU - Cui, Michael M.

AU - Adrian, Ronald

PY - 1995

Y1 - 1995

N2 - Two-color-dual-beam-sweep particle image velocimetry (TCDBSPIV) systems are designed to overcome the difficulties in two-phase flow studies. The system can automatically take a large number of pictures to obtain statistical quantities for random phenomena analysis or to gain good temporal resolution to investigate nonstationary flows. Directional ambiguities in the images are also removed, leading to improved resolution and signal to noise ratio.

AB - Two-color-dual-beam-sweep particle image velocimetry (TCDBSPIV) systems are designed to overcome the difficulties in two-phase flow studies. The system can automatically take a large number of pictures to obtain statistical quantities for random phenomena analysis or to gain good temporal resolution to investigate nonstationary flows. Directional ambiguities in the images are also removed, leading to improved resolution and signal to noise ratio.

UR - http://www.scopus.com/inward/record.url?scp=0029431486&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029431486&partnerID=8YFLogxK

M3 - Conference contribution

VL - 209

SP - 81

BT - American Society of Mechanical Engineers, Fluids Engineering Division (Publication) FED

A2 - Stock, D.E.

A2 - Tsuji, Y.

A2 - Reeks, M.W.

A2 - Michaelides, E.E.

A2 - Gautam, M.

PB - ASME

CY - New York, NY, United States

ER -