@article{a9d19e78c0ed4150a7f552ff9607e5dd,
title = "Transmission electron microscopy of native copper inclusions in illite",
keywords = "Copper inclusions, Illite, Native copper, Transmission electron microscopy (TEM), Weathering",
author = "Ahn, {Jung Ho} and Xu Huifang and Buseck, {P R}",
note = "Copyright: Copyright 2018 Elsevier B.V., All rights reserved.",
year = "1997",
doi = "10.1346/CCMN.1997.0450218",
language = "English (US)",
volume = "45",
pages = "295--297",
journal = "Clays and Clay Minerals",
issn = "0009-8604",
publisher = "Clay Minerals Society",
number = "2",
}