Transmission electron microscopy of native copper inclusions in illite

Jung Ho Ahn, Xu Huifang, P R Buseck

Research output: Contribution to journalArticle

14 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)295-297
Number of pages3
JournalClays and Clay Minerals
Volume45
Issue number2
StatePublished - 1997

Fingerprint

Weathering
Crystal lattices
Crystal orientation
Copper
Transmission electron microscopy
mica
illite

Keywords

  • Copper inclusions
  • Illite
  • Native copper
  • Transmission electron microscopy (TEM)
  • Weathering

ASJC Scopus subject areas

  • Soil Science
  • Earth and Planetary Sciences (miscellaneous)
  • Geochemistry and Petrology
  • Water Science and Technology

Cite this

Transmission electron microscopy of native copper inclusions in illite. / Ahn, Jung Ho; Huifang, Xu; Buseck, P R.

In: Clays and Clay Minerals, Vol. 45, No. 2, 1997, p. 295-297.

Research output: Contribution to journalArticle

Ahn, Jung Ho ; Huifang, Xu ; Buseck, P R. / Transmission electron microscopy of native copper inclusions in illite. In: Clays and Clay Minerals. 1997 ; Vol. 45, No. 2. pp. 295-297.
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